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8 Technical informationRFQ Specifications by request
Technical information
| Model | XC-3100 |
|---|---|
| Product type | inspection and verification item |
| Product group | SMT inspection and quality control |
| Process role | defect detection strategy, inspection coverage, and quality feedback |
| Integration point | X-ray inspection coverage |
| Selection basis | inspection target, defect criteria, line position and board complexity |
| Commercial status | Pricing and availability on request |
| RFQ focus | operator access |
Key benefits
- Ties X-ray Chip Counters X-ray Inspection System for Hidden Joint Inspection selection to defect criteria, line position and board complexity
- Documents operator access before RFQ release
- Supports inspection review for hidden solder joints and dense assemblies
- Supports defined inspection checkpoints in the SMT flow
Applications
- inspection and verification item selection for Counters Inspection Hidden
- automated SMT inspection and quality control projects needing operator access
- X-ray inspection coverage
- AOI inspection
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